What Field Diagnostics Should be Run to Test if an IO Module is Bad

Asset ID:	1-79-1529286.1
Update Date:	2017-07-25
Keywords:

Solution Type Predictive Self-Healing Sure

Solution 1529286.1 : What Field Diagnostics Should be Run to Test if an IO Module is Bad

Applies to:

Oracle Fabric Interconnect F1-15 - Version All Versions and later
Oracle Fabric Interconnect F1-4 - Version All Versions and later
Information in this document applies to any platform.

Purpose

An IO module reports different errors such as up/partialCardFailure, up/failed(xtChip) or phone home reports IO module rebooted. What field diagnostics should be run to gather more in-depth information related to the reported failure?

Details

Here is a quick way to run diagnostics in the field to determine if an IOcard is bad.

Step 1. We recommend moving the suspect card into an EMPTY IO Slot when running this test.

Step 2. Issue the following command from the user CLI, the command doesn’t support tab completion. In the example below we will test slot 15.

admin@south-dakota[xsigo] set chassis ioslot 15 iocard admin-state test
admin@south-dakota[xsigo] commit

Step 3. Once the test is started you can monitor the test with 'show iocard'

admin@south-dakota[xsigo] show iocard

slot state descr type v-resources

-----------------------------------------------------------------------------------------------------------------------------------------------------

11 up/up nwEthernet10Port1GbCard 0

12 up/up sanFc2Port4GbLrCard 1

15 up/shuttingdown(testing) nwEthernet10Port1GbCard 0

3 records displayed

Step 4. Once the card goes back to "UP/UP" state (test takes approximately 15 minutes) you can check the results by issuing the following command:

Output for a card that passes diags:

admin@south-dakota[xsigo] show chassis ioslot 15 iocard diag detail

dn last-test-status failed-test-num last-test-msg

--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------

ioslot-15:iocard:diag pass 0 llTestsPASSdsLoopsTime

1 record displayed

Output for a card that fails diags:

Test were run on a known good card (slot 15) and known bad card (slot 11), slot 11 failed diags as expected:

admin@south-dakota[xsigo] show chassis ioslot 11 iocard diag detail

dn last-test-status failed-test-num last-test-msg

--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------

ioslot-11:iocard:diag fail 7 EZchipTestXtFpgaRAMsandLoopBack

1 record displayed

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